Atomic Force Microscope | JPK Instruments, Nanowizard 3
Location: LFG, Haberstraße 9a, 91058 Erlangen, Room 01.814
The NanoWizard® 3 is an AFM system designed for optimal use in liquid characterization, but can also be used in air or a controlled environment. It provides the highest quality data for imaging and force measurements in both liquids and air. The NanoWizard® 3 is easy to set up and ready to use in minutes with full optical imaging capability, allowing the user to select high NA (numerical aperture) immersion objectives and a wide range of detectors and cameras to suit their experimental requirements.
M. Sc. Maret Ickler
Instrument specifications:
- AFM with reproducible tip positioning and long-term position stability
- Low coherence IR deflection detection light source for interference-free measurements
NanoWizard® 3 head:
- Robust, low-noise design and drift-minimised mechanics
- High detector bandwidth of 8 MHz for high-speed signal detection
- Liquid-safe design
- Built-in optical filters for fluorescence without side signal effects
- Laser safety glass 3R
- 100 x 100 x 15 µm3 scanning range
Stages:
- Liquid-tight, rugged and drift-minimized design for maximum stability
- Motorised 20 x 20 mm2 precision stage with joystick or software control, manual control also possible
- Independent positioning of tip and sample relative to the optical axis
Sample holders:
- Holders for Petri dishes, coverslips, microscope slides or SPM metal holders
- Special holders and liquid cuvettes available
- Ø 140 x 18 mm3 free sample volume
Temperature control:
- RT to 300°C, ± 0.1°C with JPK High Temperature Heating Stage (HTHSTM)
- -35°C to 120°C, ± 0.1°C with JPK Heating Cooling Module (HCMTM)
- All heaters and heating/cooling solutions are software controlled
https://www.nanophys.kth.se/nanolab/afm/jpk/jpk-nanowizard-3-bioscience.pdf
Further information to follow